Invitation to Conferences

June 14th–17th 2020

Venue: Wisła, Poland, EU

 

Two conferences will be organized in the same place and time. You can pay once and take part in two conferences. Publication: Authors of accepted presentations (oral, poster) are invited to submit their full manuscripts for publication reviewed as journal articles in journals with IF.

Invited lectures

Robert Sinclair

Prof. Robert Sinclair

Stanford University, California, USA

Invited lecture titled:

Correlative STEM-EELS and Raman Spectroscopy Studies to Optimize Gold Nanoparticles for Early Cancer Detection

Di Wang

Dr. Di Wang

Karlsruher Institut für Technologie (KIT) Institut für Nanotechnologie

Invited lecture titled:

Scanning nanobeam electron diffraction for crystalline and amorphous nanostructures

 

PTMi-logoEM'2020

The Polish Society for Microscopy has the pleasure to invite you to participate in the XVIIth International Conference on Electron Microscopy.

Chairman:
prof. Maria Sozańska
Silesian University of Technology, Poland

Conference topics

  • Sample Preparation Techniques,
  • Scanning Electron Microscopy (SEM),
  • Advances in SEM and FIB,
  • Transmission Electron Microscopy (TEM),
  • HREM and Novel Techniques,
  • In Situ Microscopy,
  • Electron Diffraction and Crystallography,
  • Electron Backscattering Diffraction,
  • Young Session,
  • Other.

More...

PTSt-logoSTERMAT'2020

The Polish Society for Stereology has the pleasure to invite you to participate in the 11th STERMAT conference.

Chairman:
The President of the Polish Society for Stereology
Agnieszka Szczotok, PhD
Silesian University of Technology, Poland

Conference topics

  • Application of stereology and image analysis methods in: material science and engineering, biological materials, medicine,
  • Advances in microscopy,
  • Image processing and analysis algorithms,
  • Theoretical stereology,
  • 3D modeling,
  • Free topics,
  • Young stereologists session,
  • Other.

More...

 

 

 

Register to STERMAT'2020

Register to EM'2020