The XVIIth International Conference
on Electron Microscopy
EM'2020
November 30th — December 2nd 2020. Online Conference
The current global pandemic situation caused by the outbreak of COVID-19 is causing a great amount of uncertainty in general, but to scientific community in particular. We would like to inform you that the planning of the 17th International Conference on Electron Microscopy 2020 is continuing. The Organising Comittee decided to postpone the event, and the Conference will be scheduled for November 30th — December 2nd 2020.
To allow maximum planning flexibility the deadlines were also changed. The new deadlines are given below:
- Abstract Submission Deadline: October 31st, 2020
- Notification Due: November 15th, 2020
- Registration Deadline: October 31st, 2020
If you already have made the reservation at the Hotel Stok, we would like to notify you that all the reservations were rebooked to a new date. The Organising Committee is doing everything possible to make the Conference take place in accordance with the new schedule.
The 11th International Conference on Image Analysis and Stereology in Materials
STERMAT'2020
Important Announcement!
Due to a worldwide situation caused by the outbreak of Coronavirus (COVID-19) and in accordance with legal requirements of the Government of the Republic of Poland we are very sorry to announce that after much discussion and consideration the Organizing Committee of the 11th International Conference on Image Analysis and Stereology in Materials, has decided to CANCEL the STERMAT conference this year.
Many countries and regions recommend self-quarantine and many institutions strongly advising staff, faculty and students to restrict travel, that is why we have settled it is impossible to continue with the STERMAT conference.
In the name of the STERMAT Organizing Committee we advise you to take care of your health and of the ones around you.
The registration fee will be returned to everyone who has already paid it.
Publication: Authors of accepted presentations (oral, poster) are invited to submit their full manuscripts for publication reviewed as journal articles in journals with IF.
Invited lectures
Prof. Robert Sinclair
Stanford University, California, USA
Invited lecture titled:
Correlative STEM-EELS and Raman Spectroscopy Studies to Optimize Gold Nanoparticles for Early Cancer Detection
Dr. Di Wang
Karlsruher Institut für Technologie (KIT) Institut für Nanotechnologie, Germany
Invited lecture titled:
Scanning nanobeam electron diffraction for crystalline and amorphous nanostructures
Dr. Katja Schladitz
Fraunhofer Institut für Techno- und Wirtschaftsmathematik (ITWM), Kaiserslautern, Germany
Invited lecture titled:
Reconstruction of porous media from FIB-SEM image stacks
Prof. Wolfgang Jaeger
Institute for Materials Science, Christian-Albrechts-University, Germany
Invited lecture titled:
Advanced and In Situ TEM for Understanding Transport Properties of Semiconductor Interfaces and Nanowires
Prof. Ehrenfried Zschech
Fraunhofer Institute for Ceramic Technologies and Systems (IKTS), Germany
Invited lecture titled:
Multi-scale Microscopy Study of 3D Morphology and Structure of MoNi4/MoO2-Ni Electrocatalytic Systems for Fast Water Dissociation
EM'2020
The Polish Society for Microscopy has the pleasure to invite you to participate in the XVIIth International Conference on Electron Microscopy.
Chairman:
prof. Maria Sozańska
Silesian University of Technology, Poland
Conference topics
- Sample Preparation Techniques,
- Scanning Electron Microscopy (SEM),
- Advances in SEM and FIB,
- Transmission Electron Microscopy (TEM),
- HREM and Novel Techniques,
- In Situ Microscopy,
- Electron Diffraction and Crystallography,
- Electron Backscattering Diffraction,
- Young Session,
- Other.
STERMAT'2020
The Organizing Committee of the 11th International Conference on Image Analysis and Stereology in Materials has decided to CANCEL the STERMAT conference this year.
Chairman:
The President of the Polish Society for Stereology
Agnieszka Szczotok, PhD
Silesian University of Technology, Poland
Conference topics
- Application of stereology and image analysis methods in: material science and engineering, biological materials, medicine,
- Advances in microscopy,
- Image processing and analysis algorithms,
- Theoretical stereology,
- 3D modeling,
- Free topics,
- Young stereologists session,
- Other.
Register to STERMAT'2020
Register to EM'2020