Invitation to Conferences


The XVIIth International Conference 
on Electron Microscopy

The 11th International Conference 
on Image Analysis and Stereology in Materials

June 14th–17th, 2020

Venue: Wisła, Poland, EU


Two conferences will be organized in the same place and time. You can pay once and take part in two conferences. Publication: Authors of accepted presentations (oral, poster) are invited to submit their full manuscripts for publication reviewed as journal articles in journals with IF.


Registration to STERMAT'2020 starts July 1st 2019.

Registration to EM'2020 to be announced.



Conference topics



The Polish Society for Microscopy has the pleasure to invite you to participate in the XVIIth International Conference on Electron Microscopy.

prof. Maria Sozańska
Silesian University of Technology, Poland

  • Sample Preparation Techniques,
  • Scanning Electron Microscopy (SEM),
  • Advances in SEM and FIB,
  • Transmission Electron Microscopy (TEM),
  • HREM and Novel Techniques,
  • In Situ Microscopy,
  • Electron Diffraction and Crystallography,
  • Electron Backscattering Diffraction,
  • Young Session,
  • Other.



The Polish Society for Stereology has the pleasure to invite you to participate in the 11th STERMAT conference.

The President of the Polish Society for Stereology
Agnieszka Szczotok, PhD
Silesian University of Technology, Poland

  • Application of stereology and image analysis methods in: material science and engineering, biological materials, medicine,
  • Advances in microscopy,
  • Image processing and analysis algorithms,
  • Theoretical stereology,
  • 3D modeling,
  • Free topics,
  • Young stereologists session,
  • Other.