Invitation to Conferences

June 14th–17th 2020

Venue: Wisła, Poland, EU


The XVIIth International Conference 
on Electron Microscopy

June 14th–17th, 2020. Venue: Wisła, Poland, EU

The 11th International Conference on Image Analysis and Stereology in Materials

Important Announcement!

Due to a worldwide situation caused by the outbreak of Coronavirus (COVID-19) and in accordance with legal requirements of the Government of the Republic of Poland we are very sorry to announce that after much discussion and consideration the Organizing Committee of the 11th International Conference on Image Analysis and Stereology in Materials, has decided to CANCEL the STERMAT conference this year. Many countries and regions recommend self-quarantine and many institutions strongly advising staff, faculty and students to restrict travel, that is why we have settled it is impossible to continue with the STERMAT conference.

In the name of the STERMAT Organizing Committee we advise you to take care of your health and of the ones around you.

The registration fee will be returned to everyone who has already paid it.

Publication: Authors of accepted presentations (oral, poster) are invited to submit their full manuscripts for publication reviewed as journal articles in journals with IF.

Invited lectures

Robert Sinclair

Prof. Robert Sinclair

Stanford University, California, USA

Invited lecture titled:

Correlative STEM-EELS and Raman Spectroscopy Studies to Optimize Gold Nanoparticles for Early Cancer Detection

Di Wang

Dr. Di Wang

Karlsruher Institut für Technologie (KIT) Institut für Nanotechnologie, Germany

Invited lecture titled:

Scanning nanobeam electron diffraction for crystalline and amorphous nanostructures

Katja Schladitz

Dr. Katja Schladitz

Fraunhofer Institut für Techno- und Wirtschaftsmathematik (ITWM), Kaiserslautern, Germany

Invited lecture titled:

Reconstruction of porous media from FIB-SEM image stacks

Wolfgang Jaeger

Prof. Wolfgang Jaeger

Institute for Materials Science, Christian-Albrechts-University, Germany

Invited lecture titled:

Advanced and In Situ TEM for Understanding Transport Properties of Semiconductor Interfaces and Nanowires

Ehrenfried Zschech

Prof. Ehrenfried Zschech

Fraunhofer Institute for Ceramic Technologies and Systems (IKTS), Germany

Invited lecture titled:

Multi-scale Microscopy Study of 3D Morphology and Structure of MoNi4/MoO2-Ni Electrocatalytic Systems for Fast Water Dissociation



The Polish Society for Microscopy has the pleasure to invite you to participate in the XVIIth International Conference on Electron Microscopy.

prof. Maria Sozańska
Silesian University of Technology, Poland

Conference topics

  • Sample Preparation Techniques,
  • Scanning Electron Microscopy (SEM),
  • Advances in SEM and FIB,
  • Transmission Electron Microscopy (TEM),
  • HREM and Novel Techniques,
  • In Situ Microscopy,
  • Electron Diffraction and Crystallography,
  • Electron Backscattering Diffraction,
  • Young Session,
  • Other.



The Organizing Committee of the 11th International Conference on Image Analysis and Stereology in Materials has decided to CANCEL the STERMAT conference this year.

The President of the Polish Society for Stereology
Agnieszka Szczotok, PhD
Silesian University of Technology, Poland

Conference topics

  • Application of stereology and image analysis methods in: material science and engineering, biological materials, medicine,
  • Advances in microscopy,
  • Image processing and analysis algorithms,
  • Theoretical stereology,
  • 3D modeling,
  • Free topics,
  • Young stereologists session,
  • Other.





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