EM'2020

The XVIIth International Conference on Electron Microscopy

Chairman:
prof. Maria Sozańska
Silesian University of Technology

Conference topics

  • Sample Preparation Techniques,
  • Scanning Electron Microscopy (SEM),
  • Advances in SEM and FIB,
  • Transmission Electron Microscopy (TEM),
  • HREM and Novel Techniques,
  • In Situ Microscopy,
  • Electron Diffraction and Crystallography,
  • Electron Backscattering Diffraction,
  • Young Session,
  • Other.

Committee

Call for Papers

Program